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|
ECLIPSE 5 - SPECIFICATIONS |
Comprehensive
Element Library.
Resistors, inductors and
capacitors (ideal/lossy, self-resonant), reactances,
complex impedances, dependent sources, ideal transformer,
multiport blackbox devices (S, Y, Z-parameters), port
terminations (impedance, gamma or black box), transmission
lines, coupled lines, attenuator, transformer, control
blocks (summing, integrator, differentiator, pole, zero,
gain), bipolar, FET and diode semiconductor models,
microstrip and stripline structures.
|
Element
Assistant
(screen
shot).
Eclipse's unparalleled Element Assistant
makes memorizing element parameters completely unnecessary.
Press F2 on an element in the netlist and the Assistant
pops up with data fields clearly labeled for all element
parameters. Each field displays context sensitive help
with full on-line documentation a mouse click away.
|
User-defined
variables
provide powerful input and output
processing capabilities. This powerful feature lets
you combine constants, Program Variables (such as Y,
Z or S-parameters, gain, current frequency, etc.), Program
Functions and other User Variables into interrelated
complex mathematical expressions. Once defined, your
"programmable" User Variables can be graphed or used
as element parameter inputs.
|
Flexible
Sweep Capability
(screen
shot).
You have complete control over circuit stimulus
and output processing through Eclipse's project notebook.
Each page contains its own definition regarding how
the circuit is to be swept. Eclipse can sweep a circuit
by changing the frequency, an element parameter or User
Variable. Element sweeping allows you to directly vary
any single parameter of any element over a chosen range
of values at a single frequency. Variable sweeping allows
you to similarly vary a User Variable; however, since
User Variables can be assigned to element parameters,
elements can be indirectly varied as well. The possibilities
are limitless.
|
Design
Versioning.
Each Eclipse project can store
up to 10 versions of a design. This allows you to keep
the history of progression from one conceptual design
to another in a single file! Each version contains all
project parameters, including netlist, variables, optimization
goals, graph sheets, etc.
|
Manual
Element Tuning
(screen
shot).
Rapidly tune multiple elements and/or User
Variables using 1%, 5% or 10% increments or standard
EIA increments (1%, 5% and 10%). Independent save/recall
registers are available for intermediate storage of
tuning values.
|
Optimization
(Professional version only)
(screen
shot).
Use Eclipse's powerful optimization features
to automatically minimize the difference between desired
and actual circuit performance. Performance goals are
formulated in terms of mathematical expressions comprised
of Program and/or User Variables. You can mix relative
as well as absolute specifications when defining goals.
Eclipse's summary box will show you the contribution
of each goal to the overall error.
|
Monte Carlo/Yield
Analysis
(Professional version only).
Predict manufacturing repeatability using Monte Carlo/Yield
analysis. While an ideal circuit with precise design
values might appear to provide acceptable performance,
the cumulative effect of component tolerances may make
the design unusable due to excessive failures during
manufacturing. Eclipse helps you to determine the repeatability
of your design by providing several graphical/tabular
views of the sampling results. Using the results of
the analysis, you can tighten or relax component tolerances
and/or performance specifications in a more informative
way.
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Output
Parameters.
S, Y, Z-parameters (1 to 4 ports),
Maximum Available Gain, group delay, voltage gain (three
types), Series or Parallel impedances (reactance displayed
as ohms, inductance or capacitance), Stability Criteria
(K, Rs_min/ Rp_max for guaranteed stability), Gain Circles.
Output can viewed in graphical or tabular form.
|
Network
Analyzer-style Markers.
Eclipse provides
four independent markers for each graph. Each marker's
X and Y values are automatically tracked and displayed
during simulation, tuning and optimization. Various
marker functions are available to enhance displayed
information.
|
Custom
Graphs
(screen
shot, Yield
Graph, Smith
Chart).
Just right mouse click on any
graph to independently customize its appearance using
the Graph Properties dialog box. For instance, with the
Autolines feature you can define additional boundary
lines to be drawn on each graph. Save traces to memory
for comparison with "live" data or enable Eclipse's
history feature to dynamically retain and display up to
5 of the most recent traces.
|
|
Industry
Standard Data Files.
Data files may be imported/exported
in industry standard format. |
ENHANCED FEATURES IN ECLIPSE VERSION 5
|
Feature
|
|
|
Monte
Carlo/Yield Analysis
(Professional version only)
|
New
|
|
Design
Versioning
|
New
|
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Constant
Gain Circles
|
New
|
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Voltages
at any node as output parameter
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New
|
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VSWR
as output parameter
|
New
|
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32-bit
performance
|
Enhancement
|
|
Unlimited
nodes
|
Enhancement
|
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Up
to 9 available ports
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Enhancement
|
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Up
to 2000 sweep points
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Enhancement
|
|
New
manual tuning increments (0.01%, 0.1%)
|
Enhancement
|
|
PRODUCT VERSION COMPARISIONS
|
FEATURE
|
ECLIPSE LITE
|
ECLIPSE
PRO
|
|
Number
of ports
|
4
|
9
|
|
Number
of nodes
|
20
|
unlimited
|
|
Number
of frequencies
|
50
|
2000
|
|
Number
of graph sheets
|
1
|
unlimited
|
|
Number
of open projects
|
1
|
unlimited
|
|
Optimization
|
no
|
yes
|
|
Monte
Carlo/Yield Analysis
|
no
|
yes
|
|
Microstrip/Stripline
models
|
no
|
yes
|
|
Semiconductor
models
|
no
|
yes
|
|
Control
block models
|
no
|
yes
|
|
Color
printing
|
no
|
yes
|
|
Manuals
*
|
no
|
yes
|
*
Full on-line help is available in both products.
|
Eclipse
5 Lite is available via Internet
download only.
Click here
for
more details.
System
Requirements
COPYRIGHT © 2008 SPECTRAWAVE ENGINEERING.
ALL RIGHTS RESERVED |WWW.SPECTRA-WAVE.COM
ANTENNA
SIMULATION | ANTENNA DESIGN | ANTENNA MODELING
| NEC-WIN BASIC | NEC-WIN PLUS
| NEC-WIN PRO
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AND ANALYSING SOFTWARE | ECLIPSE | SYSCALC | DESIGN |
SIMULATION | MODELING
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